Yamamoto et al. prepared ZFO thin films on a single-crystal sapphire substrate by using pulsed laser deposition and examined the effect of the deposition rate on its magnetic properties [9]. ZFO thin films with a microlevel scale were grown on

glass substrates by radio-frequency (RF) sputtering at room temperature, and the magnetic properties of the films were investigated [10]. Ogale et al. used a pulsed laser evaporation method to synthesize ZnO and Zn x Fe3−x O4 mixed-phase thin films on sapphire substrates using ZnFe2O4 pellets; however, this is not an efficient method for obtaining single-phase this website spinel ZFO thin films [11]. Polycrystalline ZFO films were also prepared by spin-spray deposition; however, controlling the film thickness to be less than several PI3K inhibitor hundred nanometers is challenging [12]. Although several groups have proposed the fabrication of ZFO films using versatile methodologies, the sputtering technique is promising for preparing oxide thin films with excellent crystalline selleck products quality and controllable film thickness for device applications because it is a technique that enables

large-area deposition and easy process control [13, 14]. It is well known that crystallographic features affect the properties of versatile oxide films [13, 15]. However, the crystallographic feature-dependent properties of sputtering-deposited spinel ZFO thin films are still inadequate. This might obstruct applications of such films in devices. In acetylcholine this study, ZFO thin films were grown on various single-crystal substrates by RF sputtering to fabricate ZFO thin films with varying crystallographic features. The correlation

between the crystallographic features and the characterization of the ZFO thin films was investigated. Methods ZnFe2O4 (ZFO) thin films were grown on yttria-stabilized zirconia (YSZ) (111), SrTiO3 (STO) (100), and Si(100) substrates, using RF magnetron sputtering. The yttria content in YSZ substrates was 15%. The sputtering ceramic target adopted in the experiment was prepared by mixing the precursor oxide powders of ZnO and Fe2O3 to obtain a proportion of Fe/Zn = 2, pressing the powders into a pellet, and sintering the pellet at a high temperature to achieve a high density. The thickness of the ZFO thin films was fixed at approximately 125 nm, and the growth temperature was maintained at 650°C. The gas pressure of deposition was fixed at 30 mTorr, using an Ar/O2 ratio of 2:1 for the films. The atomic percentages of the as-deposited films were calculated based on the X-ray photoelectron spectroscopy (XPS) spectra of the Zn2p, Fe2p, and O1s regions. The chemical binding states of the constituent elements of the ZFO thin films were also investigated. The crystal structures of the samples were investigated using X-ray diffraction (XRD), applying Cu Kα radiation. The surface morphology of the ZFO films was determined using scanning electron microscopy (SEM) and atomic force microscopy (AFM) at an area of 1 μm2.